scanning single electron transistor atomic force microscope (Nanoelectronics Research Corporation)
90
Structured Review
Nanoelectronics Research Corporation
scanning single electron transistor atomic force microscope
Scanning Single Electron Transistor Atomic Force Microscope, supplied by Nanoelectronics Research Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+single+electron+transistor+atomic+force+microscope/scanning+single+electron+transistor+atomic+force+microscope/10__1116_slash_1__1612931-16-17-34
Average 90 stars, based on 1 article reviews
Scanning Single Electron Transistor Atomic Force Microscope, supplied by Nanoelectronics Research Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+single+electron+transistor+atomic+force+microscope/scanning+single+electron+transistor+atomic+force+microscope/10__1116_slash_1__1612931-16-17-34
Average 90 stars, based on 1 article reviews
scanning single electron transistor atomic force microscope - by Bioz Stars,
2026-09
90/100 stars
Images
Related Articles
Microscopy:Article Title: Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope Article Snippet: Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope |